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Tong-Yi Zhang

Veröffentlichungen von Tong-Yi Zhang zu Zhang, Tong-Yi ->
weitere Veröffentlichungen von Tong-Yi Zhang:
Criteria for formation of interface dislocations in a finite thickness epilayer deposited on a substrate (1999)
Effects of absorption and desorption on the chemical stress field (2002)
Anisotropic elasticity study of the critical thickness of an epilayer on a substrate with different elastic constants (1995)
J-integral measurement for piezoelectric materials (1993)
Effect of sample width on the energy release rate and electric boundary conditions along crack surfaces in piezoelectric materials (1994)
Electrical fracture toughness for electrically conductive deep notches driven by electric fields in depoled lead zirconate titanate ceramics (2001)
Mode-III cracks in piezoelectric materials (1992)
A dislocation in a nearly polygonal isotropic domain (1996)
The critical thickness of an epilayer deposited on a semiconductor-on-insulator compliant substrate (1999)
Electrical fracture toughness for conductive cracks driven by electric fields in piezoelectric materials (2000)
Determination of residual stresses in Pb(Zr0.53Ti0.47)O3 thin films with Raman spectroscopy (2001)
Interaction of a screw dislocation with an interface crack (1991)
Interaction of an edge dislocation with an interfacial crack (1992)
An edge dislocation near a macrocrack with a microcrack (1993)
An array of dislocations in a strained epitaxial layer. II. Work hardening (1994)
Veröffentlichungen zu Zhang, Tong-Yi
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1
Zhang, Tong-Yi Criteria for formation of interface dislocations in a finite thickness epilayer deposited on a substrate
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 85, No. 11 (1999), p. 7579-7586
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1999
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2
Zhang, Tong-Yi Effects of absorption and desorption on the chemical stress field
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 91, No. 4 (2002), p. 2002-2008
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2002
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3
Zhang, Tong-Yi Anisotropic elasticity study of the critical thickness of an epilayer on a substrate with different elastic constants
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 78, No. 8 (1995), p. 4948-4957
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1995
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4
Zhang, Tong-Yi J-integral measurement for piezoelectric materials
in: International journal of fracture , ISSN 1573-2673, Vol. 68 (2. 1993), p. R33
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1993
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5
Zhang, Tong-Yi Effect of sample width on the energy release rate and electric boundary conditions along crack surfaces in piezoelectric materials
in: International journal of fracture , ISSN 1573-2673, Vol. 66 (2. 1994), p. R33
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1994
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6
Wang, Tianhong., Zhang, Tong-Yi. Electrical fracture toughness for electrically conductive deep notches driven by electric fields in depoled lead zirconate titanate ceramics
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 79, No. 25 (2001), p. 4198-4200
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2001
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7
Zhang, Tong-Yi., Hack, J. E.. Mode-III cracks in piezoelectric materials
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 71, No. 12 (1992), p. 5865-5870
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1992
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8
Tong, Pin, Zhang, Tong-Yi A dislocation in a nearly polygonal isotropic domain
in: International journal of fracture , ISSN 1573-2673, Vol. 78 (3/4. 1996), p. 241-260
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1996
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9
Zhang, Tong-Yi., Su, Yan-Jing. The critical thickness of an epilayer deposited on a semiconductor-on-insulator compliant substrate
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 74, No. 12 (1999), p. 1689-1691
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1999
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10
Fu, Ran., Qian, Cai-Fu., ... Electrical fracture toughness for conductive cracks driven by electric fields in piezoelectric materials
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 76, No. 1 (2000), p. 126-128
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2000
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11
Xu, Wei-Hua., Lu, Dexin., ... Determination of residual stresses in Pb(Zr0.53Ti0.47)O3 thin films with Raman spectroscopy
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 79, No. 25 (2001), p. 4112-4114
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2001
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12
Zhang, Tong-Yi., Li, J. C. M.. Interaction of a screw dislocation with an interface crack
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 70, No. 2 (1991), p. 744-751
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1991
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13
Zhang, Tong-Yi., Li, J. C. M.. Interaction of an edge dislocation with an interfacial crack
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 72, No. 6 (1992), p. 2215-2226
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1992
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14
Shiue, Sham-Tsong., Zhang, Tong-Yi., ... An edge dislocation near a macrocrack with a microcrack
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 74, No. 10 (1993), p. 6079-6087
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1993
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15
Zhang, Tong-Yi., Hack, J. E.., ... An array of dislocations in a strained epitaxial layer. II. Work hardening
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 75, No. 5 (1994), p. 2363-2366
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1994
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16
Zhang, Tong-Yi., Hack, J. E.., ... An array of dislocations in a strained epitaxial layer. I. Elastic energy
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 75, No. 5 (1994), p. 2358-2362
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1994
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17
Zhang, Tong-Yi., Tong, Pin., ... Interaction of an edge dislocation with a wedge crack
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 78, No. 8 (1995), p. 4873-4880
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1995
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18
Shiue, Sham-Tsong, Zhang, Tong-Yi, ... Elastic analysis of an edge dislocation and two collinear cracks of different length
in: International journal of fracture , ISSN 1573-2673, Vol. 68 (4. 1994), p. 333-350
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1994
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19
Tian, Lirong, Zhang, Hongqi, ... The Tilt of the Magnetic Polarity Axis in Active Regions with Different Polarity Separation and Flux
in: Solar physics , ISSN 1573-093X, Vol. 189 (2. 1999), p. 305-313
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1999