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Kazumi Matsushige

Veröffentlichungen von Kazumi Matsushige zu Matsushige, Kazumi. ->
weitere Veröffentlichungen von Kazumi Matsushige:
Melting and crystallization of poly(vinylidene fluride) under high pressure (1978)
Relaxations of bisphenol A-based epoxides cured with aliphatic diamines (1993)
X-ray microanalysis and acoustic emission studies on the formation mechanism of secondary cracks in PMMA (1984)
Structures of vinylidene fluoride oligomer thin films on alkali halide substrate (1999)
Quasi-intrinsic semiconducting state of titanyl-phthalocyanine films obtained under ultrahigh vacuum conditions (2000)
Analog frequency modulation detector for dynamic force microscopy (2001)
Structural evaluation of epitaxially grown organic evaporated films by total reflection x-ray diffractometer (1993)
Direct observation of phase transitions of polyethylene under high pressure by a PSPC x-ray system (1981)
Total reflection x-ray excited photoelectron spectra of copper phthalocyanine thin layer on Si wafer (1995)
Photoelectron spectra enhanced by x-ray total reflection and diffraction from periodic multilayer (1996)
Veröffentlichungen zu Matsushige, Kazumi.
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1
Matsushige, Kazumi., Takemura, Tetuo. Melting and crystallization of poly(vinylidene fluride) under high pressure
in: Journal of Polymer Science: Polymer Physics Edition, in: Journal of Polymer Science: Polymer Physics Edition . - New York : John Wiley & Sons, Inc., ISSN 0098-1273 Vol. 16 (5. 1978), p. 921-934
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1978
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2
Matsukawa, Mami., Okabe, Hirotaka., ... Relaxations of bisphenol A-based epoxides cured with aliphatic diamines
in: Journal of Applied Polymer Science, in: Journal of Applied Polymer Science . - New York, NY [u.a.] : Wiley, ISSN 0021-8995, ZDB-ID 1491105-x Vol. 50 (1. 1993), p. 67-73
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1993
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3
Matsushige, Kazumi, Sakurada, Yasuhiro, ... X-ray microanalysis and acoustic emission studies on the formation mechanism of secondary cracks in PMMA
in: Journal of materials science , ISSN 1573-4803, Vol. 19 (5. 1984), p. 1548-1555
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1984
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4
Noda, Kei., Ishida, Kenji., ... Structures of vinylidene fluoride oligomer thin films on alkali halide substrate
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 86, No. 7 (1999), p. 3688-3693
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1999
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5
Tada, Hirokazu., Touda, Hiroshi., ... Quasi-intrinsic semiconducting state of titanyl-phthalocyanine films obtained under ultrahigh vacuum conditions
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 76, No. 7 (2000), p. 873-875
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2000
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6
Kobayashi, Kei., Yamada, Hirofumi., ... Analog frequency modulation detector for dynamic force microscopy
In: Review of Scientific Instruments. - [S.l.] : American Institute of Physics, ISSN 1089-7623, Vol. 72, No. 12 (2001), p. 4383-4387
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2001
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7
Ishida, Kenji., Hayashi, Kouichi., ... Structural evaluation of epitaxially grown organic evaporated films by total reflection x-ray diffractometer
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 73, No. 11 (1993), p. 7338-7343
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1993
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8
Maeda, Yoji., Kanetsuna, Hisaaki., ... Direct observation of phase transitions of polyethylene under high pressure by a PSPC x-ray system
in: Journal of Polymer Science: Polymer Physics Edition, in: Journal of Polymer Science: Polymer Physics Edition . - New York : John Wiley & Sons, Inc., ISSN 0098-1273 Vol. 19 (9. 1981), p. 1313-1324
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1981
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9
Kawai, Jun., Kawato, Shin'ichi., ... Total reflection x-ray excited photoelectron spectra of copper phthalocyanine thin layer on Si wafer
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 67, No. 26 (1995), p. 3889-3891
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1995
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10
Hayashi, Kouichi., Kawato, Shin'ichi., ... Photoelectron spectra enhanced by x-ray total reflection and diffraction from periodic multilayer
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 68, No. 14 (1996), p. 1921-1923
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1996