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J.-M. Halbout

Veröffentlichungen von J.-M. Halbout zu Halbout, J. M.. ->
weitere Veröffentlichungen von J.-M. Halbout:
Picosecond photoelectron scanning electron microscope for noncontact testing of integrated circuits (1987)
Electrical profiling of Si(001) p-n junctions by scanning tunneling microscopy (1992)
Picosecond spin dynamics in dilute magnetic systems (1986)
High speed electron beam testing (1989)
Coherent broadband microwave spectroscopy using picosecond optoelectronic antennas (1989)
Dielectric properties of uniaxial crystals measured with optoelectronically generated microwave transient radiation (1989)
Scanning tunneling microscopy and spectroscopy of Si/SiGe(001) superlattices (1992)
Nonlinear optical properties of urea (1979)
Noninvasive picosecond ultrasonic detection of ultrathin interfacial layers: CFx at the Al/Si interface (1992)
Two-dimensional profiling of shallow junctions in Si metal-oxide-semiconductor structures using scanning tunneling spectroscopy and transmission electron microscopy (1996)
Nondestructive detection of titanium disilicide phase transformation by picosecond ultrasonics (1992)
Cross-sectional scanning tunneling microscopy of MBE-grown Si p-n junctions and Si/SiGe superlattices (1993)
Nonlinear optical processes I (1982)
Veröffentlichungen zu Halbout, J. M..
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1
Yu, E. T.., Johnson, M. B.., ... Electrical profiling of Si(001) p-n junctions by scanning tunneling microscopy
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 61, No. 2 (1992), p. 201-203
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1992
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2
May, P.., Halbout, J.-M.., ... Picosecond photoelectron scanning electron microscope for noncontact testing of integrated circuits
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 51, No. 2 (1987), p. 145-147
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1987
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3
Awschalom, D.D., Halbout, J.-M. Picosecond spin dynamics in dilute magnetic systems
in: Journal of Magnetism and Magnetic Materials, in: Journal of Magnetism and Magnetic Materials . - Amsterdam : Elsevier, ISSN 0304-8853, ZDB-ID 1479000-2 Vol. 54-57 (1986), p. 1381-1384
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1986
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4
Chiu, G., Halbout, J.-M., ... High speed electron beam testing
in: Microelectronic Engineering, in: Microelectronic Engineering . - Amsterdam : Elsevier, ISSN 0167-9317, ZDB-ID 1497065-X Vol. 9, No. 1-4 (1989), p. 21-24
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1989
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5
Pastol, Y.., Arjavalingam, G.., ... Coherent broadband microwave spectroscopy using picosecond optoelectronic antennas
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 54, No. 4 (1989), p. 307-309
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1989
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6
Pastol, Y.., Arjavalingam, G.., ... Dielectric properties of uniaxial crystals measured with optoelectronically generated microwave transient radiation
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 55, No. 22 (1989), p. 2277-2279
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1989
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7
Yu, E. T.., Halbout, J.-M.., ... Scanning tunneling microscopy and spectroscopy of Si/SiGe(001) superlattices
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 61, No. 26 (1992), p. 3166-3168
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1992
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8
Cassidy, C., Halbout, J.M., ... Nonlinear optical properties of urea
in: Optics Communications, in: Optics Communications . - Amsterdam : Elsevier, ISSN 0030-4018, ZDB-ID 1468811-6 Vol. 29, No. 2 (1979), p. 243-246
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1979
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9
Tas, G.., Stoner, R. J.., ... Noninvasive picosecond ultrasonic detection of ultrathin interfacial layers: CFx at the Al/Si interface
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 61, No. 15 (1992), p. 1787-1789
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1992
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10
Yu, E. T.., Barmak, K.., ... Two-dimensional profiling of shallow junctions in Si metal-oxide-semiconductor structures using scanning tunneling spectroscopy and transmission electron microscopy
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 79, No. 4 (1996), p. 2115-2121
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1996
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11
Lin, H.-N.., Stoner, R. J.., ... Nondestructive detection of titanium disilicide phase transformation by picosecond ultrasonics
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 61, No. 22 (1992), p. 2700-2702
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1992
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12
Yu, E.T., Johnson, M.B., ... Cross-sectional scanning tunneling microscopy of MBE-grown Si p-n junctions and Si/SiGe superlattices
in: Journal of Crystal Growth, in: Journal of Crystal Growth . - Amsterdam : Elsevier, ISSN 0022-0248, ZDB-ID 1466514-1 Vol. 127, No. 1-4 (1993), p. 435-439
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1993
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13
Ashkin, A., Smith, P. W., ... Nonlinear optical processes I
in: Applied physics , ISSN 1432-0649, Vol. 28 (2/3. 1982), p. 142-149
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1982