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M. G. Dowsett

Veröffentlichungen von M. G. Dowsett zu Dowsett, M.G. ->
weitere Veröffentlichungen von M. G. Dowsett:
Reply to comment by V. V. Makarov on ‘an analytic form for the SIMS response function measured from ultra-thin impurity layers’, by M. G. Dowsett et al. [Surf. Interface Anal. 21, 310 (1994)] (1995)
The application of surface analytical techniques to silicon technology (1991)
Maximum entropy quantification of SIMS depth profiles - behaviour as a function of primary ion energy (1994)
Characterization of the noise in secondary ion mass spectrometry depth profiles (1996)
SIMS Profile quantification by maximum entropy deconvolution (1993)
Experimental study of electrode materials for use in a cold-cathode oxygen discharge (1983)
Improved secondary-ion extraction in a quadrupole-based ion microprobe (1982)
Characterization of sharp interfaces and delta doped layers in semiconductors using secondary ion mass spectrometry (1994)
The chemical and physical speciation of trace metals in fine grained overbank flood sediments in the Tyne basin, north-east England (1989)
Determination of 4-hydroxyandrost-4-ene-3,17-dione metabolism in breast cancer patients using high-performance liquid chromatography-mass spectrometry (1991)
An analytic form for the SIMS response function measured from ultra-thin impurity layers (1994)
A study of the altered layer produced by oxygen bombardment of silicon (1988)
Static secondary ion mass spectroscopy (SSIMS) analysis of the mica surface (1978)
An electrostatic iris for use in quadrupole SIMS instruments (1984)
Profile distortions during secondary ion mass spectrometry analyses of resistive layers due to electron stimulated desorption and charging (1986)
Veröffentlichungen zu Dowsett, M.G.
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1
Dowsett, M. G.. Reply to comment by V. V. Makarov on ‘an analytic form for the SIMS response function measured from ultra-thin impurity layers’, by M. G. Dowsett et al. [Surf. Interface...
in: Surface and Interface Analysis, in: Surface and Interface Analysis . - Chichester [u.a.] : Wiley, ISSN 0142-2421, ZDB-ID 2023881-2 Vol. 23 (13. 1995), p. 900-901
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1995
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2
Dowsett, M. G. The application of surface analytical techniques to silicon technology
in: Fresenius' Zeitschrift für analytische Chemie , ISSN 1618-2650, Vol. 341 (3/4. 1991), p. 224-234
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1991
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3
Allen, P. N.., Dowsett, M. G.. Maximum entropy quantification of SIMS depth profiles - behaviour as a function of primary ion energy
in: Surface and Interface Analysis, in: Surface and Interface Analysis . - Chichester [u.a.] : Wiley, ISSN 0142-2421, ZDB-ID 2023881-2 Vol. 21 (3. 1994), p. 206-209
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1994
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4
Chu, D. P.., Dowsett, M. G.., ... Characterization of the noise in secondary ion mass spectrometry depth profiles
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 80, No. 12 (1996), p. 7104-7107
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1996
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5
Allen, P. N.., Dowsett, M. G.., ... SIMS Profile quantification by maximum entropy deconvolution
in: Surface and Interface Analysis, in: Surface and Interface Analysis . - Chichester [u.a.] : Wiley, ISSN 0142-2421, ZDB-ID 2023881-2 Vol. 20 (8. 1993), p. 696-702
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1993
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6
Dowsett, M.G., Parker, E.H.C. Experimental study of electrode materials for use in a cold-cathode oxygen discharge
in: International Journal of Mass Spectrometry and Ion Physics, in: International Journal of Mass Spectrometry and Ion Physics . - Amsterdam : Elsevier, ISSN 0020-7381, ZDB-ID 1484635-4 Vol. 52, No. 2-3 (1983), p. 299-309
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1983
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7
Wittmaack, K., Dowsett, M.G., ... Improved secondary-ion extraction in a quadrupole-based ion microprobe
in: International Journal of Mass Spectrometry and Ion Physics, in: International Journal of Mass Spectrometry and Ion Physics . - Amsterdam : Elsevier, ISSN 0020-7381, ZDB-ID 1484635-4 Vol. 43, No. 1 (1982), p. 31-39
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1982
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8
Dowsett, M.G., Barlow, R.D. Characterization of sharp interfaces and delta doped layers in semiconductors using secondary ion mass spectrometry
in: Analytica Chimica Acta, in: Analytica Chimica Acta . - Amsterdam : Elsevier, ISSN 0003-2670, ZDB-ID 1483436-4 Vol. 297, No. 1-2 (1994), p. 253-275
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1994
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9
Macklin, M.G., Dowsett, R.B. The chemical and physical speciation of trace metals in fine grained overbank flood sediments in the Tyne basin, north-east England
in: Catena, in: Catena . - Amsterdam : Elsevier, ISSN 0341-8162, ZDB-ID 1492500-X Vol. 16, No. 2 (1989), p. 135-151
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1989
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10
McPhail, D. S.., Dowsett, M. G.., ... Profile distortions during secondary ion mass spectrometry analyses of resistive layers due to electron stimulated desorption and charging
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 60, No. 7 (1986), p. 2573-2579
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1986
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11
Dowsett, M. G.., Rowlands, G.., ... An analytic form for the SIMS response function measured from ultra-thin impurity layers
in: Surface and Interface Analysis, in: Surface and Interface Analysis . - Chichester [u.a.] : Wiley, ISSN 0142-2421, ZDB-ID 2023881-2 Vol. 21 (5. 1994), p. 310-315
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1994
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12
Dowsett, M.G., King, R.M., ... Static secondary ion mass spectroscopy (SSIMS) analysis of the mica surface
in: Surface Science, in: Surface Science . - Amsterdam : Elsevier, ISSN 0039-6028, ZDB-ID 1479030-0 Vol. 71, No. 3 (1978), p. 541-547
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1978
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13
Poon, G.K., Jarman, M., ... Determination of 4-hydroxyandrost-4-ene-3,17-dione metabolism in breast cancer patients using high-performance liquid chromatography-mass spectrometry
in: Journal of Chromatography B: Biomedical Sciences and Applications, in: Journal of Chromatography B: Biomedical Sciences and Applications . - Amsterdam : Elsevier, ISSN 0378-4347, ZDB-ID 1491259-4 Vol. 565, No. 1-2 (1991), p. 75-88
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1991
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14
Dowsett, M.G., Parker, E.H.C., ... An electrostatic iris for use in quadrupole SIMS instruments
in: Nuclear Inst. and Methods in Physics Research, B, in: Nuclear Inst. and Methods in Physics Research, B . - Amsterdam : Elsevier, ISSN 0168-583X, ZDB-ID 1466524-4 Vol. 4, No. 1 (1984), p. 167-169
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1984
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15
Mattey, N. L.., Dowsett, M. G.., ... p-type delta-doped layers in silicon: Structural and electronic properties
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 57, No. 16 (1990), p. 1648-1650
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1990
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16
Willoughby, A. F. W.., Evans, A. G. R.., ... Diffusion of boron in heavily doped n- and p-type silicon
In: Journal of Applied Physics. - [S.l.], ISSN 1089-7550, Vol. 59, No. 7 (1986), p. 2392-2397
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1986
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17
Parry, C. P.., Newstead, S. M.., ... Elemental boron doping behavior in silicon molecular beam epitaxy
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 58, No. 5 (1991), p. 481-483
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1991
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18
Clegg, J. B.., Gale, I. G.., ... A SIMS calibration exercise using multi-element (Cr, Fe and Zn) implanted GaAs
in: Surface and Interface Analysis, in: Surface and Interface Analysis . - Chichester [u.a.] : Wiley, ISSN 0142-2421, ZDB-ID 2023881-2 Vol. 10 (7. 1987), p. 338-342
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1987
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19
McPhail, D. S.., Dowsett, M. G.., ... Quantifying the effects of uneven etching during the SIMS analysis of periodic doping structures grown by silicon MBEPaper presented at the Quantitative Surface Analysis (QSA-4)...
in: Surface and Interface Analysis, in: Surface and Interface Analysis . - Chichester [u.a.] : Wiley, ISSN 0142-2421, ZDB-ID 2023881-2 Vol. 11 (1-2. 1988), p. 80-87
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1988
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20
Shenton, K.C., Dowsett, M., ... Comparison of biochemical aromatase activity with aromatase immunhistochemistry in human breast carcinomas
in: Breast cancer research and treatment , ISSN 1573-7217, Vol. 49 (1. 1998), p. S101
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1998