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K. I. Arshak

Veröffentlichungen von K. I. Arshak zu Arshak, K. I. ->
weitere Veröffentlichungen von K. I. Arshak:
The voltage-current characteristics of thin MIM sandwiches with SiO x /Bi2O3 as the insulator (1985)
The effect of duty ratio in phase shift mask design (1994)
Effects of annealing on the structure, electron spin resonance and optical energy gap of thin BaO-SiO films (1986)
Designing phase shift mask structures using SIMPHAD (1994)
The optical absorption edge of amorphous thin films of silicon monoxide (1984)
Electrical and optical properties of chemically deposited conducting glass for SIS solar cells (1983)
Electron spin resonance and some electrical and optical properties of GeO2/SiO x thin films (1984)
Correlation between electron spin resonance, electrical conductivity and optical absorption edge of co-evaporated thin films of the dielectric system SiO/V2O5 (1984)
Correlation between electron spin resonance, electrical conductivity and optical absorption edge of co-evaporated thin films of the dielectric system SiO/V2O5 (1984)
A new test structure for misregistration evaluation (1990)
Resist exposure optimization using figure of merit of resist profile (1989)
The influence of non-uniform incident flux upon surface erosion processes (1979)
Veröffentlichungen zu Arshak, K. I.
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1
Arshak, K. I., Glot, A., ... The voltage-current characteristics of thin MIM sandwiches with SiO x /Bi2O3 as the insulator
in: Journal of materials science , ISSN 1573-4803, Vol. 20 (10. 1985), p. 3590-3596
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1985
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2
Mathur, B.P., Arshak, K.I. The effect of duty ratio in phase shift mask design
in: Microelectronic Engineering, in: Microelectronic Engineering . - Amsterdam : Elsevier, ISSN 0167-9317, ZDB-ID 1497065-X Vol. 23, No. 1-4 (1994), p. 143-146
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1994
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3
Arshak, K.I., Hogarth, C.A. Effects of annealing on the structure, electron spin resonance and optical energy gap of thin BaO-SiO films
in: Thin Solid Films, in: Thin Solid Films . - Amsterdam : Elsevier, ISSN 0040-6090, ZDB-ID 1482896-0 Vol. 137, No. 2 (1986), p. 281-291
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1986
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4
Mathur, B.P., Arshak, K.I. Designing phase shift mask structures using SIMPHAD
in: Microelectronic Engineering, in: Microelectronic Engineering . - Amsterdam : Elsevier, ISSN 0167-9317, ZDB-ID 1497065-X Vol. 26, No. 1 (1994), p. 37-47
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1994
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5
Al-Ani, S. K. J., Arshak, K. I., ... The optical absorption edge of amorphous thin films of silicon monoxide
in: Journal of materials science , ISSN 1573-4803, Vol. 19 (6. 1984), p. 1737-1748
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1984
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6
Agnihotri, O.P., Mohammad, M.T., ... Electrical and optical properties of chemically deposited conducting glass for SIS solar cells
in: Solid State Communications, in: Solid State Communications . - Amsterdam : Elsevier, ISSN 0038-1098, ZDB-ID 1467698-9 Vol. 47, No. 3 (1983), p. 195-198
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1983
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7
Arshak, K. I., Al-Ramadhan, F. A. S., ... Electron spin resonance and some electrical and optical properties of GeO2/SiO x thin films
in: Journal of materials science , ISSN 1573-4803, Vol. 19 (5. 1984), p. 1505-1509
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1984
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8
Al-Ramadhan, F. A. S., Arshak, K. I., ... Correlation between electron spin resonance, electrical conductivity and optical absorption edge of co-evaporated thin films of the dielectric system SiO/V2O5
in: Journal of materials science , ISSN 1573-4803, Vol. 19 (11. 1984), p. 3687-3691
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1984
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9
Al-Ramadhan, F. A. S., Arshak, K. I., ... Correlation between electron spin resonance, electrical conductivity and optical absorption edge of co-evaporated thin films of the dielectric system SiO/V2O5
in: Journal of materials science , ISSN 1573-4803, Vol. 19 (11. 1984), p. 3687-3691
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1984
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10
Kundu, N.N., Arshak, K.I., ... A new test structure for misregistration evaluation
in: Microelectronic Engineering, in: Microelectronic Engineering . - Amsterdam : Elsevier, ISSN 0167-9317, ZDB-ID 1497065-X Vol. 11, No. 1-4 (1990), p. 687-690
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1990
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11
Kundu, N.N., Arshak, K.I., ... Resist exposure optimization using figure of merit of resist profile
in: Microelectronic Engineering, in: Microelectronic Engineering . - Amsterdam : Elsevier, ISSN 0167-9317, ZDB-ID 1497065-X Vol. 9, No. 1-4 (1989), p. 595-598
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1989
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12
Carter, G., Nobes, M. J., ... The influence of non-uniform incident flux upon surface erosion processes
in: Journal of materials science , ISSN 1573-4803, Vol. 14 (3. 1979), p. 728-736
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1979