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zeige Details Siperko, L. M.., Creasy, W. R.., ... Raman studies of laser-ablated ETFE (tefzel®)Tefzel is a registered trademark of E. I. Dupont De Nemours and Co., Wilmington, De, USA. films
in: Surface and Interface Analysis, in: Surface and Interface Analysis . - Chichester [u.a.] : Wiley, ISSN 0142-2421, ZDB-ID 2023881-2 Vol. 15 (2. 1990), p. 95-99
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1990
An ethylene-tetrafluoroethylene (ETFE) copolymer film exposed to 266 nm radiation from a Nd: YAG laser (fourth harmonic) shows visible evidence of damage to the film surface in the form of blackened areas. Evidence for backbone damage to the polymer is indicated by Raman spectroscopy. MicroRaman spectroscopy of the blackened areas yields the spectrum of a carbonaceous structure superposed on the spectrum of the polymer film. Surface-enhanced Raman spectroscopy (SERS) allows the spectrum of the damaged area to be obtained without spectral interference from the underlying film, with the resultant spectrum similar to SERS spectra of graphite fibers. The carbonaceous layer is not electrically conductive, and scanning electron microscopy shows the ablated areas to be severely cracked and discontinuous.
Copyright: Copyright © 1990 John Wiley & Sons Ltd.
beteiligte Personen: Siperko, L. M.. , Creasy, W. R.. , Brenna, J. T..
Format: Elektronisch
Sprache: English
Erschienen: 1990.
Serie: Wiley InterScience Backfile Collection 1832-2000 [Dig. Serial]
Schlagwörter:
URL: http://dx.doi.org/10.1002/sia.740150206

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