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zeige Details Arshak, K. I., Glot, A., ... The voltage-current characteristics of thin MIM sandwiches with SiO x /Bi2O3 as the insulator
in: Journal of materials science , ISSN 1573-4803, Vol. 20 (10. 1985), p. 3590-3596
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1985
Abstract Regions of current-controlled and voltage-controlled negative resistance (CCNR and VCNR) have been observed in thin films of Bi2O3/SiO x with aluminium electrodes. ESCA measurements revealed the formation of metallic bismuth impurities in the dielectric, associated with a small activation energy for conductance, prior to any electroforming process. With copper electrodes only VCNR was observed. These thin films have been found to possess relatively high concentrations of dangling bonds.
Copyright: Copyright 1985 Chapman and Hall Ltd
beteiligte Personen: Arshak, K. I. , Glot, A. , Hogarth, C. A.
Format: Elektronisch
Erschienen: 1985.
Serie: Springer Online Journal Archives 1860-2000 [Dig. Serial]
Schlagwörter:
URL: http://dx.doi.org/10.1007/BF01113765

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