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zeige Details Koehler, M., Hümmelgen, I.A. Tunneling through a Metal/Polymer Interface Containing a Thin Oxide Layer: Discussion of the Consequences of Oxide Presence on Charge Injection
in: Interface science , ISSN 1573-2746, Vol. 6 (3. 1998), p. 235-241
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1998
Abstract The charge injection from oxidized metal electrodes into conjugated polymer thin films is calculated and compared with ideal metal/polymer interfaces. The presence of the oxide layer has a major influence on the magnitude of the tunneling current as well as on its behavior with applied voltage. It was also found that the fitting of the simple Fowler-Nordheim model for triangular barriers to the obtained current-voltage data from the oxidized interfaces leads to incorrect values of the potential barrier height at the metal/polymer interface. Prediction and its consequences on charge injection control in organic devices are discussed.
Copyright: Copyright 1998 Kluwer Academic Publishers
beteiligte Personen: Koehler, M. , Hümmelgen, I.A.
Format: Elektronisch
Erschienen: 1998.
Serie: Springer Online Journal Archives 1860-2000 [Dig. Serial]
Schlagwörter:
URL: http://dx.doi.org/10.1023/A:1008620403836

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