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zeige Details Burkel, E.., Dorner, B.., ... High-energy resolution in X-ray scattering with the spectrometer INELAX. I. The principles and the test instrument
in: Applied crystallography online. - Copenhagen : Munksgaard, ISSN 1600-5767, Vol. 24, No. 6 (1991), p. 1042-1050
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1991
Very high-energy resolution measurements using X-rays can be achieved by extreme backreflection (Bragg angle close to 90°) from perfect crystals. This technique, combined with the high intensity of X-rays emitted by synchrotron-radiation sources, allowed the development of the instrument INELAX for inelastic scattering experiments. The principles and test results are discussed.
beteiligte Personen: Burkel, E.. , Dorner, B.. , Illini, Th.. , Peisl, J..
Format: Elektronisch
Erschienen: 1991.
Serie: Crystallography Journals Online : IUCR Backfile Archive 1948-2001 [Dig. Serial]
Schlagwörter:
URL: http://dx.doi.org/10.1107/S0021889891007884

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Verfasser Titel Jahr
zeige Details Burkel, E. High-energy resolution in x-ray scattering for inelastic studies of excitations in condensed matter : Proceedings of the 4th international conference on synchrotron radiation...
In: Review of Scientific Instruments. - [S.l.] : American Institute of Physics, ISSN 1089-7623, Vol. 63, No. 1 (1992), p. 1094-1097
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1992
zeige Details Burkel, E., Sinn, H. Dynamics in liquids studied by inelastic X-ray scattering
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1989
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In: Review of Scientific Instruments. - [S.l.] : American Institute of Physics, ISSN 1089-7623, Vol. 72, No. 1 (2001), p. 1201-1201
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