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zeige Details Strempfer, J.., Brückel, T.., ... The Non-Resonant Magnetic X-ray Scattering Cross Section of MnF2. 2. High-Energy X-ray Diffraction at 80keV
in: Acta crystallographica. - [S.l.] : IUCR, ISSN 1600-5724, Vol. 52, No. 3 (1996), p. 438-449
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1996
Results of high-energy non-resonant magnetic X-ray diffraction experiments performed on the model system MnF2 at a photon energy of 80 keV are presented. A surprisingly high peak intensity of the magnetic 300 reflection of 13000 photons s−1 in the three-crystal mode and 19000 photons s−1 in the two-crystal mode, with a peak-to-background ratio of 230:1 and 10:1, respectively, has been achieved. At 80 keV, the penetration depth is 7 mm. When the path length of the beam through the crystal is varied, the effect of volume enhancement of the intensity diffracted by magnetic reflections is demonstrated. The Q dependence of the magnetic and the charge Bragg reflections has been measured and agrees well with theory. The measurement of the temperature dependence of the sublattice magnetization allows a very accurate determination of the critical exponent β = 0.333 (3) and the Néel temperature TN = 67.713 (2) K. Finally, the multiple charge scattering is discussed, which is very pronounced for the magnetic reflections of MnF2.
beteiligte Personen: Strempfer, J.. , Brückel, T.. , Rütt, U.. , Schneider, J. R.. , Liss, K. D.. , Tschentscher, T..
Format: Elektronisch
Erschienen: 1996.
Serie: Crystallography Journals Online : IUCR Backfile Archive 1948-2001 [Dig. Serial]
Schlagwörter:
URL: http://dx.doi.org/10.1107/S0108767396000773

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