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zeige Details Tong, Song., Liu, Xiang-na., ... Visible electroluminescence from nanocrystallites of silicon films prepared by plasma enhanced chemical vapor deposition
In: Applied Physics Letters. - Woodbury, NY : Inst., ISSN 1077-3118, Vol. 69, No. 5 (1996), p. 596-598
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1996
We have observed visible electroluminescence (EL) from silicon nanocrystallites which are embedded in a-Si:H films prepared in a plasma enhanced chemical vapor deposition system. The EL spectra are in the range of 500–850 nm with two peaks located at about 630–680 and 730 nm, respectively. We found that the intensity of EL peaks is related closely to the conductivity of the deposited films. The carrier conduction path is discussed in terms of the material structural characteristics, and a tentative explanation of the light emission mechanism is proposed. © 1996 American Institute of Physics.
beteiligte Personen: Tong, Song. , Liu, Xiang-na. , Wang, Lu-chun. , Yan, Feng. , Bao, Xi-mao.
Format: Elektronisch
Sprache: English
Erschienen: 1996.
Serie: AIP Digital Archive [Dig. Serial]
Schlagwörter:
URL: http://dx.doi.org/10.1063/1.117918

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